• Automotive eMMC

    AEC-Q100 compliant

We are proud to announce our eMMC is fully AEC-Q100 & IATF 16949 compliant for automotive applications.

Extremely High Reliability for Safe Drive
Extremely High Reliability for Safe Drive
The reliability of the future cars should be guaranteed, even in extreme conditions, for the safety of all drivers. According to this, higher qualities and standards for ensuring the durability of electronic components are being requested in automotive market. Phison has the best quality and service to meet those needs.

As the leader in the global IC designer on NAND flash controller domain, Phison offers the best Defect Parts Per Million (DPPM) management capability based on the our quality process.

Phison's eMMC especially offers fast troubleshooting through our in-house controller and firmware capability.

Long Product Lifecycle for Automotive Industry

To meet the need of car makers or their OEM suppliers, Phison is capable of extending product lifecycle and provide long-term technical support. For this, we created a special program called Phison Product Longevity Program which demonstrates our understanding of the need in automotive industry.

AUTOMOTIVE INDUSTRY DEVELOPMENT CYCLE

Design

Development

Evaluation

Pre-Production

Production

Around 2yrs from qualification process to production
Why Phison eMMC?
UNIQUE STRESS TEST FOR AUTO QUALIFICATION• Power Temperature Cycle• Early Life Failure Rate ELECTRICAL TESTRoom Temperature & High and LowTemperature Grade ESD• HBM: 500V min• CDM: 250V & 500V STRESS CONDITIONS• Grade2: -40°C~105°C• Grade3: -40°C ~85°C NAND FLASH RELIABILITY TESTDifferent patterns for data retentiontest every time COMPOSITION OF QUALIFICATION LOTS3 non-consecutive wafer lots and 3 non-consecutiveassembly lots AEC - Q100 Global Standard
Why Phison eMMC?
AEC - Q100
Global Standard
UNIQUE STRESS TEST FOR AUTO QUALIFICATION
• Power Temperature Cycle
• Early Life Failure Rate
ELECTRICAL TEST
Room Temperature & High and Low
Temperature Grade
ESD
• HBM: 500V min
• CDM: 250V & 500V
STRESS CONDITIONS
• Grade2: -40°C~105°C
• Grade3: -40°C ~85°C
NAND FLASH RELIABILITY TEST
Different patterns for data retention
test every time
COMPOSITION OF QUALIFICATION LOTS
3 non-consecutive wafer lots and 3 non-consecutive
assembly lots
Dedicated Service for Customer Requirement
The Phison team can provide more services than you expect...
Dedicated Service for Customer Requirement
IATF 16949 Certification for manufacturing
AEC-Q100 Prod. Qualify and PPAP document support
Dedicated team service for customers' requests
ECN/PCN notification and project status synchronization
Fix BOM and longer product solution supply
Full failure analysis procedures and TAT control
The Phison team can provide more services than you expect...